Display Metrology Training Course


        SID/ICDM Display Metrology Training Course




Sunday, May 8, 2022
9: 00 am – 7: 00 pm full-day session
9: 00 am – 1: 30 pm half-day session
1: 30 pm – 7: 00 pm half-day session
Room: 220B 

Scheduling Note: The timing of the metrology sessions makes it possible to combine a half-day session with a short course. Example: Attendees with an interest in AR/VR technology may wish to combine the morning short course S-3: Design of Waveguides for Augmented-Reality Displays with the afternoon metrology sessions, which are devoted to AR/VR topics.  A morning metrology session from 9:00 am to 1:30 pm allows you to attend an afternoon short course from 3:00 to 7:00 pm.

Lunch and evening breaks will feature product demonstrations from major metrology equipment manufacturers. Full-day registrations include a box lunch.

Moderator: Jongseo Lee, Google

Platinum Sponsor


Gold Sponsor



Silver Sponsor



Room: 220B

Time: 9:00 am – 9:45 am


ICDM 1.1 Overview 

Brian Berkeley, Principal, Highlight Display

In July 2021, SID’s International Committee for Display Metrology (ICDM) announced an update to the Information Display Measurements Standard (IDMS). IDMS v1.1 is the first major update to the IDMS in over nine years. More than 250 pages of new content cover areas including color capability characterization, high-dynamic-range displays, new temporal methods, and more than 100 pages on evaluation methods of near-eye displays. Prior content from IDMS v1.0 has also been expanded in many areas including 3D methods, extension of the reflection chapter to include transmissive displays, spatial performance updates, and other improvements. The update is both commercially and scientifically significant. This talk will open the SID/ICDM Display Metrology Training Course with a look inside the newly released IDMS, explaining how the new version addresses the needs of modern displays using the latest metrology methods.


Room: 220B

Time: 9:45 am – 11:00 am


Color Capability, Color Volume, and Gamut 

Karl Lang, President, Lumita
(Presented by Euan Smith, Managing Consultant, 42 Technology)

The purpose of this section of the course is to provide an overview of the new ICDM methods to describe Display Color Capability. Both data collection and analysis will be covered. This talk will introduce the Gamut Envelope measurement, the Color Volume Metric, the Gamut Intersection Metric, and the new important Gamut Rings Diagram.


Room: 220B

Time: 11:00 am – 12:00 pm


Measuring Displays Under Ambient Illumination

John Penczek, Senior Research Associate, University of Colorado, Boulder

This course will introduce the mathematical framework, fundamental concepts, and measurement best practices used in the IDMS for evaluating display photometric and colorimetric characteristics under ambient illumination. A general methodology is presented for evaluating the observed display photometric/colorimetric attributes in the presence of reflected and transmitted light. A phenomenological approach is used to describe the primary reflection/transmission characteristics commonly exhibited by displays, and guidance is given for measuring them.

Time: 12:00 pm – 1:30 pm

Q&A, Equipment Demos & Lunch


Room: 220B

Time: 1:30 pm – 7:00 pm


AR/VR Metrology Sessions

Afternoon Session with ICDM Experts

The purpose of the following three sessions is to provide attendees with the knowledge to choose appropriate test methods that evaluate AR/VR near-eye display (NED) attributes that quantify visual performance and device characteristics related to perceived quality. The course covers the fundamental concepts, best practices, and standard measuring methods for performing optical and optical radiation measurements of augmented- and virtual-reality NED devices. An introduction into the basic concepts of radiometry, photometry, and colorimetry is first presented to build the foundation for the material. We then review the requirements of light-measuring devices (LMDs) and their diverse designs. The course also discusses how these LMDs are applied in measuring important NED optical characteristics. Several best practice measuring methods recently published in the ICDM International Display Measurements Standard (IDMS) and IEC measurement standards are reviewed. The last part of the course offers demonstrations of LMDs and systems for augmented- and virtual-reality measurements.


1:30-2:50 pm            AR/VR Radiometry and Photometry
                                    John Penczek, Senior Research Associate, University of Colorado, Boulder


2:50-4:20 pm            AR/VR Geometry, Terminology, and Light Measuring Devices 
                                    Richard Austin, President & Chief Technology Officer of Gamma Scientific 


4:20-5:20 pm            AR/VR Measurement Methods 
                                    John Penczek, Senior Research Associate, University of Colorado, Boulder
                                    Richard Austin, President & Chief Technology Officer of Gamma Scientific 

5:30-7:00 pm            Q&A, Equipment Demos & Refreshments

Metrology Course Presenter Bios

Richard L. Austin

President &
Chief Technology Officer
of Gamma Scientific

Brian Berkeley

Principal, Highlight Display

Karl Lang

President, Lumita

John Penczek

Senior Research Associate,
University of Colorado, Boulder

Euan Smith

Managing Consultant,
42 Technology


Richard L. Austin is the president & chief technology officer of Gamma Scientific. With more than 40 years of experience in the design and development of optical radiation measurement instrumentation, Austin is a subject matter expert in the measurement of luminous intensity, flux, and spectral gonio-apparent characterization of retroreflective materials and information display color, luminance, and spatial and temporal performance characterization. His instrument systems development expertise includes computer-controlled scanning grating and diode array/CCD spectroradiometers and telespectroradiometers.  His working knowledge of light-source characterization and metrology ranges from lamp-based devices such as tungsten, to the latest in LED, VCSELs, microLED, and information-display devices. He is the inventor and co-inventor of seven patents, including two for near-eye display measurement apparatus and methods. His work has found use in a broad range of applications, including: head-up display and direct-view display characterization for the F-16, F-18 and C-17, F-117 and F-35 military aircraft and commercial displays, quality assurance and process control for antireflection and other thin-film coatings, LED, flash lamp, and lamp-based systems.  He served the ASTM E12 Color and Appearance Committee as a subcommittee working group chair, drafting standards for measurement methods and performance standards for retroreflective highway safety materials, and is also a member of several CIE Division 2 Technical committees. He is currently serving as a subject matter expert on several IEC TC110 technical committees responsible for the creation of display color, luminance, and resolution measurement standards.  


Brian Berkeley received S.B. and M.S. degrees in electrical engineering from M.I.T. and Carnegie-Mellon University, respectively. He had a 20-year career at Apple, Inc., starting as display engineer on the first Macintosh. He put color on the Macintosh, led all Apple display development, and led hardware development for the first iMac computer. In 2003, he took on a role as VP of engineering at Samsung Display in South Korea. In his eight years in Korea, he had major successes in LCD and OLED research and panel development. In early 2012, he moved back to Silicon Valley to start up Samsung Display’s USA laboratory, which he led for three years. Since 2015, he has been an industry consultant as principal for Highlight Display, LLC. Berkeley has over 50 display industry publications with more than 750 citations. He has been an SID member for over 30 years and has served on the SID Program Committee for more than 25 years. He served as the SID Symposium Technical Program Chair (2000) and General Chair (2002) and served on the SID Executive Board for 10 years (2006-2016), including two years as SID’s President (2012-2014). He helped rebuild SID during a critical transition period. He was awarded SID Fellow in 2012 and has received six Presidential Citations for his service to SID. He currently remains active with SID on its Program Committee, the Display Industry Awards Committee, and as an Executive Committee member of SID’s International Committee for Display Metrology (ICDM).


Karl Lang is a color scientist and the president of Lumita, Inc. With 30 years’ experience in display metrology, color, and digital imaging, Lang has been involved with numerous products for a wide range of companies including Apple, Adobe, and Sony. The Radius PressView, The ProSense Colorimeter, ColorMatch software, Apple Photo Books, and the Sony Artisan Color Reference Display System are a few of these. He serves as an expert in various display metrology standards organizations including IEC WG13, WG10 and the ICDM. Lang is the chairperson of the ICDM Color Volume and Accuracy Workgroup.

John Penczek is a senior research associate at the University of Colorado, Boulder, and guest researcher at the National Institute of Standards and Technology, Boulder, Colorado.  Dr. Penczek has been developing optical and electro-optic devices and systems for over 30 years, much of that time in the information display technology area. During that time, he was involved in product development at starts-ups, corporate research at large companies, and applied research at NIST and several universities. His more recent research involved display metrology development for 3D, transparent, and augmented/virtual-reality displays. Dr. Penczek is also a long-serving sub-committee chair in the ICDM, and a US expert on display metrology in IEC and ISO international standards.

Euan Smith is a managing consultant for 42 Technology, a technology consultancy based in the UK. He has over 25 years’ experience of commercially facing technology development including photonics, displays, imaging, algorithms, optical metrology, and web technologies, addressing consumer, commercial, and industrial markets. He is an inventor on ~40 patent families, >160 patents in total, covering displays, optics, image processing and touch interaction. Dr. Smith is a long-standing technical expert in IEC TC110 (electronic displays), currently in WG9 (touch interaction), WG10 (laser displays) and WG13 (optical measurements), and is a member of the ICDM. He also maintains open-source software including a library of tools for gamut volume analysis. He has a Ph.D. in nonlinear optics from Heriot Watt University.